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Sto caricando le informazioni... On-Wafer Microwave Measurements and de-Embeddingdi Errikos Lourandakis
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This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards. Non sono state trovate descrizioni di biblioteche |
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Google Books — Sto caricando le informazioni... GeneriSistema Decimale Melvil (DDC)621.3813Technology Engineering and allied operations Applied physics Electrical, magnetic, optical, communications, computer engineering; electronics, lighting Electronics, communications engineering ElectronicsClassificazione LCVotoMedia: Nessun voto.Sei tu?Diventa un autore di LibraryThing. |